International conference details
Statistical Analysis of Measurement Uncertainty Metrology - 2017
Fremont (United States), 18 April 2017
Domain:
Key deadlines
- Conference starts:
- 2017-04-18
Website
Conference Description
Overview:
The webinar begins with an examination of the fundamental vocabulary and concepts related to metrology. Topics include: accuracy, precision, calibration, and "uncertainty ratios".
The webinar ends with an explanation of how to combine all relevant uncertainty information into an "Uncertainty Budget" that helps determine the appropriate width of QC specification intervals.
Why should you Attend:
All manufacturing and development companies perform testing and/or
inspection that involves measurements of products, components, and/or raw materials. The output of those measurements is compared to design or QC specifications, to determine whether or not the measurements "pass" those specifications.
Areas Covered in the Session:
Fundamental Vocabulary & Concepts
Gage R&R (ANOVA method)
Gage Correlation
Gage Linearity
Who Will Benefit:
QA/QC Supervisor
Process Engineer
Manufacturing Engineer
QC/QC Technician
Manufacturing Technician
R&D Engineer
Speaker Profile:
John N. Zorich has spent 35 years in the medical device manufacturing industry; the first 20 years were as a "regular" employee in the areas of R&D, Manufacturing, QA/QC, and Regulatory; the last 15 years were as consultant in the areas of QA/QC and Statistics. His consulting clients in the area of statistics have included numerous start-ups as well as large corporations such as Boston Scientific, Novellus, and Siemens Medical.
Contact Detail:
Compliance4All DBA NetZealous,
Phone: +1-800-447-9407
Email: support@compliance4All.com
Conference creator: compliance4all
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Conference Location
18004479407 161 Mission Falls Lane, Suite 216,,
Fremont 94539 (United States)